Senior Test Engineer
- Burlington, ON, Canada
$110,000 to $130,000 CAD / year · Full-time
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Job details
- Pay
- $110,000 to $130,000 CAD / year
- Job type
- Full-time
- Apply by
- Experience
- 6+ years of semiconductor test engineering experience
- Posting language
- English
- Posted
Original job description
Position: Senior NPI Test Engineer
Location: Burlington, Ontario (Hybrid)
Role Type: Permanent
Pay Rate: $110,000 - $130,000 CAD base + RSUs, bonuses and benefits
Required Skills & Experience
- BS in Electrical/Computer Engineering (or related)
- 6+ years of semiconductor test engineering experience
- Experience owning NPI programs (concept → production)
- Hands-on experience with Advantest V93000 (93K) / SmarTest 7/8, Teradyne uFlex/UtraFlex, Cohu, OR Chroma
- Hands-on experience with analog/mixed-signal ICs.
- Knowledge of DFT (BIST, scan, boundary scan)
Nice to Have Skills & Experience
- RF experience
- High-speed (signal integrity, jitter, BER, >40GHz)
- SerDes / CDR / high-speed I/O (200Gbps+)
- Advantest 93K instruments (PS1600/PS3600, Wave Scale RF)
- Teradyne uFlex (HSD200, DC30) + capacitive sensing
- Automotive (AEC-Q100) knowledge
- PCB design (Cadence, Altium), wafer-level test, probe cards
- Data analytics / ML for yield improvement
Job Description
Insight Global is seeking a Senior NPI Test Engineer to serve as the technical authority and strategic leader for new product introduction test development in our mixed-signal product portfolio. This role demands a proven innovator who can architect comprehensive test solutions spanning from early silicon validation through high-volume production. The ideal candidate will drive testability standards across the organization, lead complex multi-disciplinary projects, and deliver breakthrough test methodologies that enable next-generation high-speed communication products operating at 200Gbps and beyond.
Key Responsibilities:
- Develop/debug ATE test programs on Advantest V93000 (93K)
- Support test development on Teradyne uFlex for analog/sensing products
- Review test hardware designs (load boards, probe interfaces)
- Perform hands-on lab work: bring-up, silicon debug, and production release
- Partner with design teams on DFT and testability requirements
- Support characterization, correlation, and test readiness reviews
- Transfer solutions to OSAT/manufacturing sites and drive yield improvements
- Mentor junior engineers and build reusable test IP/documentation
Disclaimers:
- Artificial intelligence tools are used to assist in screening and assessing applicants for this position.
- This position is an existing vacancy.
More about this job
Responsibilities
Develop and debug ATE test programs for mixed-signal products, perform hands-on silicon bring-up and debug, review test hardware, and support characterization and production release. Lead NPI test development from early validation through high-volume manufacturing, coordinate with design and manufacturing teams, improve yield, and mentor engineers while building reusable test documentation and IP.
Requirements
Requires a bachelor's degree in Electrical or Computer Engineering or a related field, at least six years of semiconductor test engineering experience, and ownership of NPI programs from concept through production. Candidates need hands-on experience with ATE platforms such as Advantest V93000 or Teradyne uFlex and analog/mixed-signal ICs, plus knowledge of DFT; RF, high-speed interfaces, automotive qualification, PCB design, and yield analytics are advantageous.
Skills
- Semiconductor Test Engineering
- New Product Introduction
- Advantest V93000
- SmarTest 7/8
- Teradyne uFlex/UltraFlex
- Analog/Mixed-Signal ICs
- Design for Test
- ATE Test Program Development
- Silicon Validation and Debug
- Test Hardware Design
- Characterization and Correlation
- Yield Improvement
- High-Speed Communications
- SerDes/CDR
- RF Testing
- DFT (BIST, Scan, Boundary Scan)
Benefits
- Restricted Stock Units
- Bonuses
- Benefits
Visa sponsorship
Not detected in the job text
Categories
- Engineering
- Manufacturing
- Technology
- Management & Leadership
Keywords
- Semiconductor
- New Product Introduction
- Test Engineering
- ATE
- Advantest V93000
- SmarTest 7/8
- Teradyne uFlex
- UltraFlex
- Cohu
- Chroma
- Analog/Mixed-Signal ICs
- Design for Test
- BIST
- Scan Testing
- Boundary Scan
- RF
- Signal Integrity
- Jitter
- BER
- SerDes
- CDR
- High-Speed I/O
- AEC-Q100
- Cadence
- Altium
- Wafer-Level Test
- Probe Cards
- Yield Improvement
- OSAT
- Machine Learning